Products

Our Product

DT – 100 SERIES


  • STAND-ALONE SEMICONDUCTOR MULTI CHANNEL ELECTRICAL TEST SYSTEM (Open, Short, Leakage for PCB and IC Testing).
  • STAND ALONE MULTI CHANNEL BASIC SEMICONDUCTOR TEST SYSTEM.
  • SUITED FOR HIGH SPEED OPEN, SHORT, LEAKAGE PCB AND COMPONENT TESTING.
  • CAPABLE OF CONFIGURING FROM 32 TO 64 OUTPUT CHANNELS.
  • FLEXIBLE CONFIGURATION UP TO 100 PROGRAMMABLE TEST AND MEASURE STEPS.
  • CAPABLE OF INTEGRATING UP TO 2 INDEPENDENT SOURCE MEASURE UNITS (SMU).
  • PROGRAMMABLE VOLTAGE SUPPLY -+10V, 250mA.
  • MULTIPLE CURRENT AND VOLTAGE RANGE TO INCREASE ACCURANCY, FLEXIBILITY AND SPEED.
  • TRUE 4 QUADRAT SOURCING CAPABILITY FOR EACH CHANNEL.
  • STABLE RATED ANALOG POWER SUPPLY IN ORDER TO ENSURE LOW NOISE RIPPLE TO TEST CIRCUITS.
  • CUSTOM SOFTWARE INTERFACE WITH NETWORK CAPABILITY FOR DIRECT DATA TRANSFER AND REMOTE MONITORING.
  • INTERFACE RS-232, WITH OPTIONAL RS-485, USB, 16-BIT OPTO-I/O.
  • OPERATOR USER ENTRY KEYPAD.
  • MULTI-SEGMENT LED AND LCD DISPLAY for PASS/FAIL STATUS.

DT – 200 SERIES


    MULTI CHANNEL OPEN SHORT, LEAKAGE IC TESTER Parametric Test.

  • MULTI CHANNEL TRANSISTOR TEST SYSTEM WITH HIGH VOLTAGE OR HIGH CURRENT.
  • SUITED FOR HIGH SPEED OPEN, SHORT, TRANSISTOR LEAKAGE AND GAIN TESTING.
  • OPTION FOR 2 TO 1024 OUTPUT TEST CHANNELS.
  • FLEXIBLE CONFIGURATION UP TO 100 PROGRAMMABLE TEST AND MEASURE STEPS.
  • CAPABLE OF INTEGRATING UP TO 10 INDEPENDENT SOURCE MEASURE UNITS (SMU).
  • MULTIPLE CURRENT AND VOLTAGE RANGE TO INCREASE ACCURANCY, FLEXIBILITY AND SPEED.
  • OPTION FOR MULTIPLE TEST OR LOAD BOARDS IN ORDER TO PROVIDE MULTI CHANNEL SOURCING AND MEASURING THROUGH SMU BOARD.
  • TRUE 4 QUADRAT SOURCING CAPABILITY FOR EACH CHANNEL.
  • THRYSTER EFFECT TEST CAPABILITY.
  • 4 WIRE TEST METHODOLOGY WITH KELVIN SENSE.
  • STABLE RATED ANALOG POWER SUPPLY IN ORDER TO ENSURE LOW NOISE RIPPLE TO TEST CIRCUITS.
  • CUSTOM SOFTWARE INTERFACE WITH NETWORK CAPABILITY FOR DIRECT DATA TRANSFER AND REMOTE MONITORING.
  • INTERFACE RS-232, RS-485, USB, 32-bit Opto-Isolated I/O.

DT – 500 SERIES


    MULTI CHANNEL TESTER SEMICONDUCTOR PC Base MULTI CHANNEL ELECTRICAL DC TEST SYSTEM (Open, Short, Leakage suitable for PCB test, component and IC test).

  • MULTI CHANNEL SEMICONDUCTOR TEST SYSTEM WITH HIGH VOLTAGE OR HIGH CURRENT.
  • SUITED FOR HIGH SPEED OPEN, SHORT, LEAKAGE PCB AND COMPONENT TESTING.
  • OPTION FOR 2 TO 1024 OUTPUT TEST CHANNELS.
  • FLEXIBLE CONFIGURATION UP TO 100 PROGRAMMABLE TEST AND MEASURE STEPS.
  • CAPABLE OF INTEGRATING UP TO 10 INDEPENDENT SOURCE MEASURE UNITS (SMU).
  • MULTIPLE CURRENT AND VOLTAGE RANGE TO INCREASE ACCURANCY, FLEXIBILITY AND SPEED.
  • OPTION FOR MULTIPLE TEST OR LOAD BOARDS IN ORDER TO PROVIDE MULTI CHANNEL SOURCING AND MEASURING THROUGH SMU BOARD.
  • TRUE 4 QUADRAT SOURCING CAPABILITY FOR EACH CHANNEL.
  • THRYSTER EFFECT TEST CAPABILITY.
  • 4 WIRE TEST METHODOLOGY WITH KELVIN SENSE.
  • STABLE RATED ANALOG POWER SUPPLY IN ORDER TO ENSURE LOW NOISE RIPPLE TO TEST CIRCUITS.
  • CUSTOM SOFTWARE INTERFACE WITH NETWORK CAPABILITY FOR DIRECT DATA TRANSFER AND REMOTE MONITORING.
  • INTERFACE RS-232, RS-485, USB, 32-bit Opto-Isolated I/O.

DT – 550 SERIES


    WITH MULTI CHANNEL OUTPUT & INTEGRATED SPECTROMETER PHOTOMETER

  • MULTI CHANNEL LED TEST SYSTEM WITH HIGH VOLTAGE OR HIGH CURRENT.
  • SUITED FOR HIGH SPEED AUTOMATED LED TESTING FOR OPEN, SHORT, LEAKAGE TESTING.
  • INTEGRATED SPECTROMETER FOR UP TO 200nm – 1100nm MEASUREMENT.
  • CONFIGURABLE FIXTURE FOR CIE-B OR SPHERE MEASUREMENT.
  • SPECTROMETER READING OUTPUT IN nm, Purity, chromatocity coordinates, power corrected to lm, W (based on calibration and fixture).
  • OPTION FOR 2 TO 1024 OUTPUT TEST CHANNELS.
  • FLEXIBLE CONFIGURATION UP TO 100 PROGRAMMABLE TEST AND MEASURE STEPS.
  • CAPABLE OF INTEGRATING UP TO 10 INDEPENDENT SOURCE MEASURE UNITS (SMU).
  • MULTIPLE CURRENT AND VOLTAGE RANGE TO INCREASE ACCURANCY, FLEXIBILITY AND SPEED.
  • OPTION FOR MULTIPLE TEST OR LOAD BOARDS IN ORDER TO PROVIDE MULTI CHANNEL SOURCING AND MEASURING THROUGH SMU BOARD.
  • THRYSTER EFFECT TEST CAPABILITY.
  • 4 WIRE TEST METHODOLOGY WITH KELVIN SENSE.
  • STABLE RATED ANALOG POWER SUPPLY IN ORDER TO ENSURE LOW NOISE RIPPLE TO TEST CIRCUITS.
  • CUSTOM SOFTWARE INTERFACE WITH NETWORK CAPABILITY FOR DIRECT DATA TRANSFER AND REMOTE MONITORING.
  • I/O INTERFACE RS-232, RS-485, USB, 32-bit Opto-Isolated I/O.

DT – 600 SERIES


    HIGH CURRENT TESTER Suitable for Power Semiconductor Devices (MOSFET, IGBT, DIODE, SCR, TRANSISTOR) UP TO 100A each channel Pulse 1 – 100mS Up to 10 separate channel source and sense

  • Multi Channel HIGH CURRENT Sourcing Capability, UP TO 100A .
  • Multi Channel LOW Current Sourcing Capability.
  • Programmable pulse from 1 to 100 mS.
  • Suitable for Automated (high speed) or bench top Lab type high current test system.
  • UP to 10 separate SMU channels for source and sense.
  • High Current channel voltage compliance 0 – 15V.
  • FLEXIBLE CONFIGURATION UP TO 100 PROGRAMMABLE TEST AND MEASURE STEPS.
  • 4 WIRE TEST METHODOLOGY WITH KELVIN SENSE.
  • STABLE RATED ANALOG POWER SUPPLY IN ORDER TO ENSURE LOW NOISE RIPPLE TO TEST CIRCUITS.
  • Software interface to Automated handler.
  • CUSTOM SOFTWARE INTERFACE WITH NETWORK CAPABILITY FOR DIRECT DATA TRANSFER AND REMOTE MONITORING.
  • I/O INTERFACE RS-232, RS-485, USB, 32-bit Opto-Isolated I/O.

DT – 630 SERIES


    WITH MULTI CHANNEL STACKABLE IC TEST SYSTEM

  • INDIVIDUAL ON-BOARD MICROPROCESSOR FOR ACCURATE AND FAST PROCESSING
  • DUAL INDEPENDENT HIGH PRECISION SOURCE AND MEASUREMENT UNIT
  • HIGH FLEXIBILITY VIA MULTI-LAYER MUX CONNECTION FOR EACH CHANNEL
  • OPTION OF UP TO 512 INDEPENDENT CHANNELS FOR INCREASED IC TESTING FLEXIBILITY
  • FLEXIBLE SYSTEM CONFIGURATION IS ACHIEVED BY STACKING, TO PROVIDE UP TO 5K TEST CHANNELS
  • 2 INDEPENDENT HIGH PRECISION MULTI-RANGE SOURCE AND MEASUREMENT UNITS
  • TRUE 4 QUADRANT SOURCING CAPABILITY FOR EACH CHANNEL, USING 4-WIRE TEST METHODOLOGY
  • MULTIPLE CURRENT AND VOLTAGE RANGE TO INCREASE ACCURACY AND SENSITIVITY
  • HIGH PRECISION MEASUREMENT CAPABILITY CAN BE ACHIEVED USING TRUE 4-WIRE TEST METHODOLOGY FOR EACH CHANNEL
  • TRUE HIGH PRECISION 24-BIT ADC SENSE CIRCUITS
  • SHIELDED NOISE SUPPRESSION POWER SUPPLY TO ENSURE LOW CURRENT ACCURACY
  • STANDALONE OR NETWORKED CONFIGURATION
  • CUSTOM SOFTWARE INTERFACE WITH TCP/IP CAPABILITY FOR DIRECT DATA TRANSFER AND REMOTE MONITORING
  • COMPACT CASING DESIGN WITH INDUSTRIAL DOUBLE SHIELDING DESIGN
  • EASY MAINTENANCE VIA INTERCHANGEABLE FRONT SLOT REMOVABLE MODULAR UNITS
  • INTERFACE OPTIONS RS-232, RS-485, USB, DIGITAL OPTO-ISOLATED IO, TTL

JEC - Java Embedded Controller


The answer to your networked mission critical remote data acquisition and control applications.

Testlogics JAVA Embedded Network Controller series are small but mighty Application Ready Platforms for your networked Applications. Without hard disk and fan, our Data Acquisition and Control modules meets the industrial most robust environmental conditions, while leveraging on its embedded JVM (Java Virtual Machine) and standard JAVA language programming support through “Slush”, a UNIX like command shell interface. Slush, while supporting multi-threaded and multi-user environments, also provides conveniences such as network accessibilities such as Telnet and FTP via Ethernet (RJ-45) TCP/IP.

Key Built-In Features which includes Web server, FTP server, Telnet server and NFS server ensures that Testlogics JAVA Embedded Network Controller Modules are “network-ready” for the future of IT and communication industry.

While common standard application and drivers are available for free, specific application programs can easily be developed using standard JAVA and the provided SDK (free).

JAVA, being a higher-level language compared to C/C++, provides superior memory and IO management. With OS and Application programs on board ROM and battery backed RAM (guaranteed for 10 years), users can be assured of a robust operating system with high speed access, without risk of data loss due to power failure.

GONIOMETER


Goniometer is a unit designed for testing and measures light, angular parameter of Intensity, Wavalength and is equipped with a customized testing application that runs on a Personal Computer.

The Goniometer is designed for light testing and measurement. The mechanical structure consists of a movable Device Under Test (DUT), Spectrometer with cosine fiber detector, laser alignment with a target plate that are all fabricated on a 27 feet (approximately 8.23 meter) long optical bench.

The Goniometer is designed for light testing and measurement. The mechanical structure consists of a movable Device Under Test (DUT), Spectrometer with cosine fiber detector, laser alignment with a target plate that are all fabricated on a 27 feet (approximately 8.23 meter) long optical bench.

Displaywork Goniometer for light measurement and testing.

Device Unit Test (DUT) equipped with scales for different angular rotation.

The testing software application that is implemented in the PC, together with a flat screen monitor, printer, and LCD UPS are located in the computer rack respectively.

The Rack with standard LCD Monitor, Printer, CPU and UPS.

LCD Monitor with mouse and keyboard.

CIMARS

Testlogics provides a range of turn-key and custom Industrial Automation which includes:

  • Small to medium scale network enabled attendance system with database.
  • Scalable network remote acquisition & control system.
  • Computer Integrated Manufacturing Activity & Reporting System ( CIMARS ).
  • Design for:

  • Design for remote monitoring for water / valves / flow Pneumatic System.
  • Facility remote network control system.
  • Manufacturing Product Lines require an effective on-line monitoring system for:

  • Automated Machine & Conveyor Performance Tracking
  • QA Purposes
  • Production Control Purposes
  • Maintenance Purposes
  • Trouble Shooting Purposes
  • Data Logging Purposes
  • Tool Usage & Maintenance Tracking
  • Up Time / Down Time Monitoring